Study of the formation, crystallization and electrical properties of Pd(0.83?x)XxSi0.17 (X=Fe, Co, Ni;x=0.05, 0.10, 0.15) metallic glasses

Abstract

The substitution of Fe, Co, and Ni (upto 15 at. %) for Pd in Pd-Si metallic glasses raises the crystallization temperature and stability in the order of Fe, Co, and Ni as checked by resistivity and DTA techniques. The 2KF (diameter of the Fermi sphere) is calculated using the nearly free electron model, and the values ofKP (wave number) are determined from the x-ray diffractograms. The criteria of Nagel and Taue (KP=2KF) is found to be valid for all the glasses. The room temperature electrical resistivityϱ293K also increases in the order of Fe, Co, and Ni, and the values are three times higher as compared to the crystalline state. All these glasses show a linear temperature dependence of resistivity between 77K andTcr and some of them are also checked down to 10 K.ϱ−1dϱ/dI values are ∼ 10−4 between 77 K andTcr and increase by a factor of 10 upon crystallization. For some glasses a threestep transition from the amorphous to the crystalline state is observed. In general, ϱ drops upon crystallization but in the case of Pd0.83Fe0.05Si0.17 it increases upon crystallization.Tcr increases with the heating rate.Tcr also increases with the increase in ϱ293K and decrease ofϱ−1dϱ/T.