Abstract
Abstract In this work we present our results on the deposition and characterization of polymorphous silicon (pm-Si:H) films prepared by low frequency plasma enhanced chemical vapor deposition (LF-PECVD). We have studied the effect of the plasma deposition parameters (as the chamber pressure and gas flow rates of SiH4 and H2) on the structural, electric, and optical characteristics of the films. The temperature dependence of conductivity (σ(T)), activation energy (Ea), optical band gap (Eg) and deposition rate (Vd) were extracted for pm-Si:H films deposited at different pressure values and different gas flow rates. We observed that the chamber pressure is an important parameter that has a significant effect on the electric characteristics, and as well on the morphology of the pm-Si:H films (deduced from atomic force microscopy). It was found an optimal pressure range, in order to produce pm-Si:H films with high Ea and room temperature conductivity, σRT, which are key parameters for thermal detection applications.
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