Abstract
The structural perfection of CdTe, (Cd,Zn)Te, and Cd(Te,Se) single crystals grown by the vertical Bridgman method was characterized by chemical etching and X-ray double-crystal topography as well as rocking-curve halfwidths. The developed etchants were proved to be sensitive to dislocations. The quality of the studied crystals varies in a wide range, but it corresponds to that of the best melt-grown II–VI crystals reported up to now. Cd(Te,Se) shows the lowest tendency to form substructures and yielded an excellent topograph and very small rocking-curve halfwidths.
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