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Abstract
A new approach to determine additions of chromium and study its distribution in the bulk and on the surface of SnO2-based nanocrystalline semiconductor materials using inductively coupled plasma–mass spectrometry (ICP–MS) is proposed. Potassium rhodanide is proposed to be used for determining chromium on the surface without dissolving tin. In samples synthesized by the sol–gel method, 20–30% of chromium is on the surface of materials and 70–80% is distributed in the bulk, regardless of the amount of modifier added.
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