Abstract
ABSTRACTWe have used the intensity and tunability of a synchrotron x-ray source in order to access the buried interface between a glass substrate and a liquid crystal thin film. We find that for energy of 9.4kev, the x-rays can penetrate a 0.22mm substrate. Grazing Incidence x-ray Scattering has been used to study the alignment of the films as a function of depth and temperature. Our results indicate the presence of both a chevron structure and a structure similar to the helical twist-grainboundary (TGB) phase. Some films have a disordered interfacial layer. This technique can be applied in the study of semiconductor devices as well as surfactant film interfaces.
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