Study of the adhesion between a-CH films and TA6V substrates by electron-induced X-ray emission spectroscopy (EXES)

Abstract

The Ti 3d valence states have been analyzed by electron-induced soft X-ray emission spectroscopy (EXES) in the TA6V bulk alloy and at a-CH/TA6V and a-SiO x C y H/TA6V interfaces. These states stem from metallic titanium in both cases. In contrast, EXES analysis shows that aluminum is in an oxide environment. Both aluminium compounds have a different behaviour depending on the presence of a-SiO x C y H in contact with the alloy. Adherence of a-CH films on the TA6V alloy can be explained from physicochemical interactions.