Abstract
Abstract An AFM study is reported on swift heavy irradiated Si/SiO 2 substrates which have been etched by aqueous hydrofluoric acid solution leading to ion tracks in which ferrofluids have been deposited leading to t unable e lectronic m aterials with p ores in o xide on s ilicon (TEMPOS) structure. Two ferrofluids with different carrier fluids (aqueous and non-aqueous) have been deposited in the tracks. Atomic force microscopy has been used to study the empty as well as filled tracks. Since the ferrofluids contain iron oxide particles, there is a possibility of agglomeration of these particles inside and outside the tracks. Surface area and pore volume of the tracks have been measured by Brunauer-Emmett-Teller (BET) method. The track properties (empty and filled) as observed by AFM have been correlated with BET measurements.
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