Abstract
Platinum metal catalysts supported on silica gel and alumina have been examined by wide-angle anomalous X-ray scattering at the Cornell High Energy Synchrotron Source. Complete removal of the support background features is achieved by this method, eliminating errors due to inaccurate background estimation. Platinum diffraction patterns from very high percentage metal exposed catalysts have been obtained for the first time, as well as from platinum supported on alumina. This technique is suitable for examining catalysts under working conditions and is superior to EXAFS for determinations of particle morphology and size distribution.
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