Abstract
The Ba1-xZrxTi0.98Y0.02O3 ceramics (where x = 0.00 to 0.10) were prepared using a solid-state reaction process, and their structural, dielectric, and electrical properties were investigated. The X-ray diffraction (XRD) spectrum confirmed the creation of the tetragonal perovskite structure. Disc- and toroid-shaped samples are made from each constituent and sintered at 1250°C temperature for 3 h. The lattice parameters decline with the enhance in Zr content comply with Vegard's law. The particle size increases as the Zr content increases, suggesting a lower surface to bulk ratio. The X-ray and bulk density slightly decline with enhancing Zr content. Dielectric constant (ϵ′) and dielectric loss (tanδE) decline with enhancing Zr content. AC conductivity enhances with enhancing frequency, indicating an increase in grain influence in the conduction process at higher frequencies and also confirming the small polaron hopping mechanism. The long-range to the short-range motion of the charge carrier increases with the increment of Zr content. Impedance spectroscopy analysis confirms the low resistive semiconducting performance of the samples. The Nyquist plot confirms that only grain boundary is prominent for the conduction process.
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