Abstract
The energy deposit effects of radiation were studied clearly in the past century; the mass deposit effects of low-energy ion beam radiation were assumed but not certified. In this study, the products of α-Naphthyl Acetic Acid (NAA) subject to implantation of 30 keV nitrogen cations were identified by combined gas-chromatography mass-spectrometry. One of the products appeared to be formed by a mass deposit effect and another of the products appeared to be formed by an energy deposit effect. The results indicate the dual effects of ion implantation and also certify the assumption of mass deposit effects.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
