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Abstract
The interface roughness of thermally grown giant magnetoresistance (GMR) multilayers was investigated with nanometer depth scale by Rutherford backscattering spectroscopy (RBS) using a high-resolution magnetic spectrograph. Co/Cu multilayers were prepared by electron beam evaporation under ultra-high vacuum conditions in an MBE system. The samples were measured by RBS under several scattering angles to obtain the concentration depth profiles. Ion beam mixing effects deduced from the experimental data and theoretical models were used to unfold the experimental spectra, giving the initial interface roughness. It is shown that the interface roughness, comparable to the amount of surface roughness, is probably not responsible for the extremely weak GMR effect, found in this type of samples.
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Schedule a callMore From: Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
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