Abstract
Radiation damage effects in a PIPS particle detector have been studied by direct irradiation with a 4 MeV He + focused ion beam, using the Eindhoven scanning ion microprobe set-up. This set-up enables extreme sensitivity and accuracy in pulse-height measurement. Pulse-height dependence on ion dose and the lateral variations of pulse-height response after damaging were studied, for different bias voltages. Pulse height was found to decrease linearly with ion dose and this could be observed after only a few ions per scan position, corresponding to a dose of 10 8/cm 2. Pulse-height loss was found to be restricted to damaged detector areas. Consequences of this pulse-height dependence on ion dose and scan position for the accuracy of STIM analyses are discussed.
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