Abstract
AbstractSecondary ion mass spectrometry (SIMS) has been applied to the study of superficial layers of solid inorganic salts such as sulfate and sulfite of sodium. The positive and negative SIMS spectra of sulfate and sulfite show qualitatively no difference. Nevertheless, the relative heights of the peaks m/e ▪ 149 and m/e = 165 which are present in both spectra enable a distinction between Na2SO3 and Na2SO4. According as the solid is sulfite or sulfate, the intensity of the (Na3SO3)+ is higher or lower than the intensity of (Na3SO4)+. The positive SIMS spectra can be interpreted according to a model where ejected neighbouring atoms or clusters recombine depending upon their chemical affinity and where molecular species (Na2SO3), (Na2SO4), are cationized by sodium. Reduction of the salts into metallic sodium has also been observed.In this work, we also demonstrate that the superficial oxidation of sulfite into sulfate can be monitored by SIMS.
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