Study of Inner-Shell Excitation and Relaxation Processes in Atomic and Ionic Neon by Means of Soft X-Ray Spectroscopy

Abstract

By using soft X-ray spectroscopy, we investigate the inner-shell excitation and relaxation processes in atomic and ionic neon targets. Resonant X-ray emission spectroscopy was applied to neutral neon atom in the regions of the [1s]np (n = 3, 4, …, ∊) excited states and [1s2p]3pmp (m = 3, 4) doubly excited states to obtain the spectroscopic information on the [2p]np and [2p2]3pmp final electronic states, where square brackets indicate hole states. The energy levels of the [2p2]3pmp (m = 3,4) electronic states were spectroscopically measured for the first time. As for the ionic neon target, on the other hand, the photoion yield spectroscopy was adopted to survey the 1s → np (n = 2, 3) resonant excitation and subsequent Auger decay processes for Ne+ target-ions. The observed Ne2+ photoion yield spectrum is successfully explained by the theoretical calculations based on the multiconfiguration Dirac-Fock method.