Abstract
A review of growth methods used to produce Cd 1− x Zn x Te (CZT) (0.0< x<0.20) crystals for radiation detector applications is presented. Most of the results emphasize the high-pressure Bridgman (HPB) method. For selected melt-grown HPB ingots, the liquid/solid segregation coefficients of some impurities were measured. The correlation of the impurity content and nuclear detector performance will be discussed. Extended defects and surface and bulk crystallinity were measured using triple and double axis X-ray diffraction techniques (TAD and DAD XRD), X-ray topography, and infrared microscopy. X-ray diffraction maps and IR images were generated and compared to gamma-ray detector tests to correlate macroscopic defects with the nuclear detector responses. Defects states of CZT were also investigated using low-temperature photoluminescence spectroscopy. Comparisons between the material and detector properties for different CZT growth methods will be discussed.
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