Abstract
We have observed numerically the history effect, based on bulk flux pinning framework, in the susceptibility χ(T) (acs), experimentally measured in different samples. The dependencies of history effect in χ(T) on frequency, ac and dc fields, and bulk pinning strength are calculated. Our calculation matches well the behavior of χ in 2H–NbSe2, showing the bulk model works well. It is also shown that bulk pinning and surface pinning will result in a history effect of very different characteristics. In addition, the numerical result shows that a peak in critical current density, which is usually accompanied by the vortex melting transition, may not be observed as a dip in acs in some cases, which is a dynamic response of a sample to applied as field and is dependent on ac field frequency and amplitude.
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