Abstract
Paramagnetic defects in electron irradiated Yb-doped Na-aluminosilicate glasses were studied. In particular, we paid more attention to characterize the defects with Electron Paramagnetic Resonance in links with the glass structure which was analyzed by Raman spectroscopy and Magic Angle Spinning Nuclear Magnetic Resonance. Under e−-irradiation hole centers on non-bridging oxygens bonded to Si with close presence of Na+, peroxy radicals, hole centers on oxygens bonded to Al (Al-OHC) and E′ centers were detected. Doping glasses with Yb gives rise to more Al-OHC defects. Formations of hole centers and Al-OHC defects as well as their sequential relaxation are linearly anticorrelated. After the end of irradiation, the total amount of paramagnetic defects decreases in 2months and then remains stable. The relaxation curve presents 2 regions with different rates of defect recovery. We showed in particular that the presence of Yb-clusters in the glasses acts on the relaxation of paramagnetic point defects by decreasing significantly the recovery of defects.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
