Abstract
In this work, the study of copolymer acrylic films was carried out on a laser photoelectric ellipsometer LEF-ZM-1. In this work, we consider a chemical sensor based on an integrated optical sensing element, propose structural schemes of IOCS, as well as conduct studies on a simulation model and assess the potential for detecting changes in the concentration of various substances. For this, in the course of the work, we studied the change in the refractive indices of polymer films with a Navbahor bentonite content of 5 wt.%, Depending on the time of their swelling in aqueous solutions containing Cr ions. The most important characteristics for acrylic copolymers are mechanical strength and sorption, since it is the values of these parameters that impose significant restrictions on the field of their application. Therefore, in this article, in addition to ellipsometry, the effect of the initiator concentration on the absorption properties of polymer composites and the influence of the synthesis temperature on the absorption properties of copolymer composites containing Navbahor bentonite are also studied. During the study, it was clarified that acrylic mineral-containing composites obtained at 42°C have the maximum sorption ability.
Highlights
Current trends in the development of thin-film technologies and the semiconductor industry inevitably lead to a decrease in the characteristic dimensions of the created structures [1,2,3,4]
We have studied the possibility of replacing imported water-absorbing sorbents of domestic production based on alkaline bentonite of the Navbahor Deposit and styreneacrylamide copolymers [18,19,20]
As can be seen from the figure, the dependence of the equilibrium degree of swelling based on bentonite (Navbahor deposit) containing styrene-acrylic copolymer of composites on the experimental temperature is extreme
Summary
Current trends in the development of thin-film technologies and the semiconductor industry inevitably lead to a decrease in the characteristic dimensions of the created structures [1,2,3,4]. This places high demands on analytical tools for controlling the parameters of layered structures during their production: composition of layers, crystalline perfection of materials, and primarily their geometric characteristics - layer thicknesses. A special place in this series is ellipsometry [5,6,7] This is an optical method based on an analysis of the polarization state of light reflected from a sample. Ellipsometry applications are not exhausted, many new experiments can be put in the form of our work
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