Abstract
This paper presents the results of direct laser recording on a two-layer amorphous silicon / silver structure deposited on a glass substrate by magnetron sputtering. The absorption spectra of a-Si films of various thicknesses and a glass substrate are investigated. A method is proposed for direct laser recording of microstructures by focused radiation of a single-mode semiconductor laser with a wavelength of λ = 405 nm on a two-layer a-Si / Ag medium from the side of a glass substrate. The formation of the micro relief is studied during direct recording by semiconductor laser pulses with λ = 405 nm on the a-Si layer. Parameters of two-layer structure a-Si / Ag for direct laser recording are optimized.
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