Abstract
In the present study we emphasized on the dielectric properties of Ethylene Vinyl Acetate (EVA) filled with untreated and plasma-treated graphene oxide (GO). The chemical fingerprints of EVA/GO were analysed using FTIR. Decreased ID/IG ratio from 2.99 to 2.75 and 1.60 to 1.16 due to exposed plasma was confirmed by Raman spectroscopy. X-ray diffraction (XRD) disclosed the decreased degree of crystallinity. Electric properties were measured by impedance analyser, dielectric constant was increased upto 11% for untreated GO dispersion and 47% for Air treated Plasma GO dispersed EVA composites. Plasma treatment further improved the exfoliated sites of GO and induced the defects, leading to optimized dielectric properties. Improved dielectric properties of EVA/GO can provide valuable insights into the potential applications in the field of electrical connectors, film capacitors, and pseudo capacitors.
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