Abstract
Results of differential scanning calorimetry of high purity As 40Se 60− x Te x ( x = 0 – 40 ) chalcogenide glasses are reported. The characteristic temperatures were studied under nonisothermal conditions. The activation energy of the glass transition ( E g ), the activation energy of crystallization ( E c ), the Avrami exponent ( n), the frequency factor ( K o ) and the crystallization criteria of these glasses were determined. The present investigation indicates that the crystallization of high purity As 40Se 60− x Te x ( x = 0 – 40 ) depends from glass composition and impurity content and occurs in a single stage with one- or two-dimensional crystal growth. The glass having the minimal tendency to crystallization is As 40Se 40Te 20.
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