Abstract
We investigate the cross section of transmitted X-ray beam diffracted by reflecting atomic planes (10–11) of a SiO2 single crystal in Laue geometry for different values of temperature gradient applied to the crystal. It is shown that the angular width of a fully pumped X-ray beam depends on the distance between the source and the studied sample and decreases with the increase in this distance.
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More From: Journal of Contemporary Physics (Armenian Academy of Sciences)
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