Abstract
In this paper, an open-switch fault diagnosis method for five-level H-Bridge Neutral Point Piloted (HB-NPP) or T-type converters is proposed. While fault tolerant operation is based on three steps (fault detection, fault localization and system reconfiguration), a fast fault diagnosis, including both fault detection and localization, is mandatory to make a suitable response to an open-circuit fault in one of the switches of the converter. Furthermore, fault diagnosis is necessary in embedded and safety critical applications, to prevent further damage and perform continuity of service.In this paper, we present an open-switch fault diagnosis method, based on the switches control orders and the observation of the converter output voltage level. In five-level converters such as HB-NPP and T-type topologies, some switches are mostly 'on' at the same time. Therefore, the fault localization is quite complicated. The fault diagnosis method we proposed is capable to detect and localize an open-switch fault in all cases. Computer simulations are carried out by using Matlab Simulink and SimPowerSystem toolbox to validate the proposed approach.
Highlights
In the recent decades, the high-power and Medium-Voltage (MV) industrial applications have increased significantly
H-Bridge Neutral Point Piloted or T-type converters are increasingly being used in industrial applications
In order to avoid its propagation in the whole system, a fast and robust fault diagnosis method must be implemented to perform the reconfiguration of the converter
Summary
The high-power and Medium-Voltage (MV) industrial applications have increased significantly. The Multilevel Converter (MC) topologies could provide significant advantages for these applications, such as output waveforms improvement and low switching frequency. Among the different MC topologies, the Neutral Point Piloted (NPP) converter is one of the widely used in high-power industrial applications, more. When fault occurrence is considered, one of the most critical elements in power electronic converters are the semiconductor switches. Switches or gate drivers faults, resulting in open-circuit fault (OCF) or short-circuit fault (SCF), affect the power generation and may lead to its shutdown. A new OCF detection method with faulty switch localization capability is proposed. The principle of the proposed fault detection method is summarized and detailed .
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