Studies on Structure of Silicate Glaze by Infrared Reflection Method

Abstract

The structure of silicate glaze was studied by infrared reflection method.The results obtained were as follows:1. The main reflection peak (about 1100cm-1) of silicate glasses shifted to lower wave number with the increse of content of basic and aluminium ions contained in the glass structure.The effect of alkali, alkali earths, and aluminium ions on the Si-O bond shift became more remarkable with the increase of ionic valency and radius.The causes of shift to lower wave number of the infrared reflection peak were considered to be as follows.a. By the electrostatic interaction between cation and oxygen atom, the Si-O bond strength was decreased in the silicate glass structure as compared with silica glass.b. The increase of number of cation in the structure of silicate glass extends the mean Si-O linkage of random network, and lengthens the atomic distance of Si-O bond, therefore weakens the Si-O field strength.2. The cation entered into the structure of silicate glass broaded the peak, because the cation extends the network structure and consequently the field strength of Si-O bond becomes random.That effect increases with the increase of electrostatic interaction between cation and oxygen atom.3. The peak shifts to lower wave number, with the increase of number of cation in the structure of silicate glass.But in the case of precipitating crystal in the glaze, wave number shifted to higher, for the reason that the effect of crystallization is dominant to peak shift and the field strength of Si-O bond increases.