Abstract
AbstractThe growth process conditions affect quality of the crystal. Structural defects such as grains, twin boundaries and precipitates are formed during the crystal growth. The defects (especially‐inclusions) at the surface can be investigated in a microscale by the scanning electron microscopy (SEM). It is shown in the article that a well known etchant, usually used for visual inspection of the quality of the CdTe‐related crystals, can be applied to the preparation of the (Cd,Mn)Te surface for SEM investigations.Samples, cut from different parts of a (Cd,Mn)Te crystal, were ground, mechano‐chemically polished, and treated by the special etchant (to indicate polarity and to reveal twinning). After that treatment the defects (grain and twin boundaries, tellurium inclusions) at the surface became much more accessible for both SEM and visual investigations. (© 2014 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)
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