Studies of the performance of OPAL single-sided FOXFET detectors in a test beam

Abstract

This report summarizes the results of an analysis of test beam data taken with the silicon detectors identical to those used in the back-to-back OPAL microvertex detector which was installed in March 1993. The detector configuration consisted of two outer reference detectors and a central detector. The test beam analysis procedure and systematic studies are described briefly. Results for runs with different incident angles are compared. The efficiency of the back-to-back detector in both r - φ and r - z are measured to be better than 99%. Assuming all detectors have the same resolution at zero degree incidence angle, the r - φ and r - z preliminary resolutions obtained for the back-to-back detectors are 4.8 μm and 11.5 μm, respectively.