Abstract
By using synchrotron radiation we have performed simultaneous measurements of the change of wide angle X-ray scattering (WAXS), small angle X-ray scattering (SAXS) and light scattering (LS) in the course of crystallization of polymers. By comparison of the change of the integrated SAXS intensity with the change of the intensities of the crystal reflections it was possible to determine the changes in structure during secondary crystallization in the case of different morphologies like spherulites, elliptical particles and rods. Three different processes are discussed: Increase of crystal thickness, formation of new crystals within the lamellar stacks, and formation of new lamellar stacks
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