Abstract
In the studies of the materials used in practical heterogeneous catalysis scanning transmission electron microscopy (STEM) is particularly suited for the characterization of particle size, shape, structure and composition of inhomogeneous catalyst systems by the combined use of a variety of techniques. Recently a high resolution surface imaging technique has been realized in STEM by collecting secondary electrons (SE) emitted at the exit surface of the sample. The application of this imaging mode to the study of supported metal catalysts has proven very useful in the characterization of the support topography with subnanometer resolution. However these studies are confined to extremely thin areas due to the fact that the incident beam will be scattered before encountering the exit surfaces of the sample. This will affect the resolution of SE images, especially for the study of high surface area support materials such as γ-Al2O3 carriers. Furthermore it has been frequently found diat metal particles are not usually seen in the SE images even when the particles are situated on the exit surfaces of the supporting materials.1 As part of an on-going project for characterizing supported catalysts we report here some preliminary results on high resolution SE imaging of supported catalysts in a UHV STEM.
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Schedule a callMore From: Proceedings, annual meeting, Electron Microscopy Society of America
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