Studies of LGAD performance limitations, Single Event Burnout and Gain Suppression, with Femtosecond-Laser and Ion Beams

Abstract

Gain suppression effects and destructive events caused by highly energetic single particles should be considered for the operation of LGADs in experiments. The performance of the LGADs depends on the particle’s ionization density (energy loss) as well as incident angle, while large deposits of energy in the active zone of LGADs operated at high bias voltages can lead to the destructive break down of the sensor. Herein, we summarize the main findings from a study at the ELI Beamlines laser facility and from an ionized dense charge induced gain suppression (GS) study using a nuclear microbeam probe station and MeV ions at Ruder Boskovic Institute (RBI). The transient currents technique (TCT) with a fs-laser has been used for the SEB study, while the Ion Beam Induced Charge (IBIC) technique has been employed for the GS study.