Abstract
Series of sputter-deposited Fe3 nm/Crx multilayer and Fe/Cr/Fe trilayer films have been analyzed. The small magnetoresistance exhibited by the multilayer films is attributed to very rough interfaces and poor Cr layer quality. The hysteresis loop data show the interlayer exchange coupling to be predominantly antiferromagnetic. In situ magnetizing of the trilayer films in a Lorentz TEM showed that for a 1.2 nm thick Cr layer the moments of the Fe layers lie approximately parallel at remanence rotating to antiparallel only when the field is increased. The magnetic moments in an Fe12 /Cr0.6 nm/Fe12 nm trilayer film were found to be parallel aligned under an applied field whereas the hysteresis loop for the multilayer films with the same Cr thickness suggest the existence of antiferromagnetic interlayer exchange coupling.
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