Abstract
The polycrystalline samples of Li4P2O7 were prepared by solid-state reaction technique. The formation of the compounds was checked by X-ray diffraction technique (XRD). Detailed dielectric and electrical properties of the compounds were analyzed as a function of frequency (200 Hz–5 MHz) and temperature (611–671 K). The impedance data were well fitted to two equivalent electrical circuits. The results of the modulus study reveal the presence of two distinct relaxation processes suggesting the presence of grains and grain boundaries in the sample. Analysis of the dielectric constants e″ and loss tangent tan (δ) with frequency shows a distribution of relaxation times. The activation energy found from the Arrhenius plot confirms that the conduction process in the material is not due to simple hopping mechanism. The temperature dependence of frequency exponent s was investigated to understand the conduction mechanism in Li4P2O7. The overlapping large polaron tunneling (OLPT) model can explain the temperature dependence of the frequency exponent.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.