Abstract
The R M values of phenol and 19 methylated phenols on thin layers of cellulose impregnated with formamide, N-methylformamide or N,N-dimethylformamide are shown to be linearly realted to the log of the concentration of the amide in the slurrying medium used in the preparation of the layers. The deviations from the R M theory occurring at low and high amide concentrations are explained.
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