Stuck-at faults, PPMs rejects or? What do the SIA roadmaps say?

Abstract

In 1995, the Semiconductor Industry Association (SIA) has released its updated National Technology Roadmaps for Semiconductors. In this document an attempt has been made to define trends in the test technology area in a rigorous fashion, with a much broader focus on design and test. Because of the dominate position of the US in semiconductors, this roadmap can be seen as an international road map thus very influential on the worldwide electronics industry. In the test technology parts of the road maps it can be seen that the general approach of defect oriented testing at block and IC level using I/sub DDq/ testing combined with voltage testing proposed in this report is supported. One minor problem area foreseen in the SIA 1995 roadmaps by Philips, amongst others, is the uncertainty on the position of open defects and corresponding open fault models. It is foreseen that fault models for opens should be planned for the period 2005-2007 in the next series of SIA roadmap.