Abstract
The structures of $[\mathrm{Fe}/\mathrm{Cr}(\mathrm{Sn})\mathrm{Cr}{]}_{39}$ superlattices with submonatomic Sn layers embedded in Cr layers have been determined by x-ray reflectivity and diffuse scattering measurements. The scattering contrast between the nanometer-thick Fe and Cr layers was controlled using the anomalous dispersion technique at synchrotron sources. In the samples investigated, the submonatomic Sn is unlikely to diffuse away or cluster but is likely to form ultrathin layers of $0.05$ to 0.2 nm in thickness within the Cr layers. The Cr/Sn interfaces have a roughness structure similar in mean-square roughness and in-plane cutoff length to the Fe/Cr interfaces. The roughness structures of both Cr/Sn and Fe/Cr interfaces are highly correlated through the entire superlattice. The work demonstrates the power of the x-ray scattering near the absorption edges to discuss the structure of ultrathin Sn layers less than the monolayer thickness.
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