Abstract
A systematic study on structures and microwave dielectric properties of Ti-doped CeO2 ceramics with various Ti contents synthesized via the traditional solid-state reaction method was carried out in this work. A cubic fluorite structural solid solution was formed in the Ti content range of 0.05–0.1. X-ray photoelectron spectroscopy and Raman results indicated Ti3+ ions and oxygen vacancies appeared easily when the sintering temperature was beyond 1200 °C, which would significantly impact the quality factor (Q×f) property. The dielectric constant (εr) was positively correlated to the relative density and Ti content for all the samples. The temperature coefficient of resonant frequency (τf) increased with the Ti content increasing, and came up to a near-zero value of −2.49 ppm/°C at the 0.875CeO2-0.125TiO2 composition with the εr of 27.38 and Q×f of 12,950 GHz, which could meet the actual requirements of microwave devices.
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