Abstract
Crystal structure and the microwave dielectric properties of xMgTiO 3–(1− x)MgTa 2O 6 sintered specimens with x = 0.3, 0.5, 0.7 are investigated. The X-ray diffraction patterns revealed the sintered specimens are mixed phases of MgTiO 3, MgTa 2O 6 and MgTi 2O 5. The microwave dielectric properties are strongly correlated with the sintering temperature and the composition. With x = 0.7, a new microwave dielectric ceramic material 0.7MgTiO 3–0.3MgTa 2O 6 at 1460 °C for 3 h is suggested for microwave device and it possesses excellent dielectric properties; a dielectric constant ɛ r ∼ 23, a Q × f value ∼81,000 GHz and a τ f value ∼−2 ppm/°C. The correlation between microwave dielectric properties and the microstructures is also discussed.
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