Abstract
Structured polymer brushes are readily prepared by AFM lithography and show improved mechanical properties over structured polymer films obtained on spin-coated films by using the same method. The figure shows an array of 200-nm-diameter pillars obtained on a 30-nm-thick polystyrene brush by cross writing of single scan lines.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
