Abstract
Structured illumination microscopy (SIM) is an established microscopy technique typically used to image samples at resolutions beyond the diffraction limit. Until now, however, achieving sub-diffraction resolution has predominantly been limited to intensity-based imaging modalities. Here, we introduce an analogue to conventional SIM that allows sub-diffraction resolution, quantitative phase-contrast imaging of optically transparent objects. We demonstrate sub-diffraction resolution amplitude and quantitative-phase imaging of phantom targets and enhanced resolution quantitative-phase imaging of cells. We report a phase accuracy to within 5% and phase noise of 0.06 rad.
Highlights
In biological microscopy, there has been a continued drive towards increasing imaging resolution for relevant samples [1]
In the case of structured illumination of the sample (e), the coherent image included the structured interference at the sample and the net raw interferogram consisted of competing interferences between the normal carrier frequency and the sample’s structured illumination
In the reconstructed amplitude image in the case of structured illumination (h), we see the sinusoidal structured illumination pattern overlayed on the sample structure
Summary
There has been a continued drive towards increasing imaging resolution for relevant samples [1]. In cases where better resolution is still required, this drive leads to a need to extend the imaging resolution to beyond the system’s diffraction limit Such a need has driven the development of many unique sub-diffraction imaging techniques that have made large impacts for microscopy. The final image will have a net frequency support synthesized from all the individual diffraction-limited frequency regions, which is responsible for the image’s sub-diffraction resolution [6,7,8,9,10]. This is a central theme in most synthetic aperture techniques
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