Abstract
We apply a Fourier ptychographic algorithm for fluorescent samples using structured illumination. The samples are illuminated with structured light patterns and the raw imaging data using traditional structured illumination fluorescence microscopy (SIM) are acquired. We then extract equivalent oblique illuminated images of fluorescent samples from the SIM images. An optimized Fourier ptychography algorithm is proposed, which ensures the fidelity of the reconstructed the super-resolution results. This method can break the diffraction limit to a resolution of λ/4, and has a better signal-to-noise ratio (SNR) than SIM, especially when the background noise is high.
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