Abstract
In an investigation of structure–property–processing relationships for SWCNT thin film piezoresistive sensors, the gauge factor of the sensors for a small tensile deformation (less than 2% strain) was found to be close to unity and showed negligible dependence on the film thickness and SWCNT bundle length (L) and diameter (d). However, for a large tensile deformation (20–30% strain), the film thickness and the microstructure of SWCNTs had a compounding effect on the piezoresistive behavior. A gauge factor of ∼5 was obtained for the sensors fabricated with SWCNT bundles of short length and thin diameter (L=549nm and d=3.7nm) with thicker films. Furthermore, the gauge factor of the sensors was found inversely proportional to the excluded volume Vex of SWCNT bundles (Vex∝1/L2d).
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