Abstract
Direct electrochemomechanical deformation (ECMD) behavior in the electrodeposited freestanding films of polypyrrole (PPy) doped with naphthalene sulphonic acid (NSA) has been investigated using cyclic voltammetry and cyclic step-voltammetry. It has been found that NSA doped PPy exhibits different film morphology when it was electrodeposited on to the different substrates such as non-corrosive stainless steel, indium-tin-oxide glass and platinum being used as anode. The differential behavior in ECMD characteristics observed on PPy film deposited on different substrates are associated with differential microstructures and porosities of the film as evidenced by scanning electron microscopic observations. An attempt has been made to correlate the effect of film morphology and the relative porosity of the film on the ECMD characteristics in the NSA doped PPy freestanding films.
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