Abstract
AbstractVLSI memories have been diversifying along with high density and high speed. With diversification, the evaluation test program also must handle each VLSI memory, and the efficiency of its generation is an important issue.In this paper, to evaluate diversifying VLSI memories, a program structure is described which can create evaluation test programs quickly for semiconductor test equipment, especially memory testers. The test program presented herein has a module structure consisting of utility groups for evaluation, a main program, and subroutine programs which describe the specific test conditions for each VLSI memory. Also, it can handle the evaluation of various VLSI memories with minimum programming.As a result of using this program structure for the evaluation test programs for 16 kinds of VLSI memories, it has been confirmed that the program development time can be reduced to one‐fifth that of the conventional method and the evaluation time can also be reduced by one hour.
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