Abstract
Details of the atomic structure for the Si(100)-(2\ifmmode\times\else\texttimes\fi{}1) surface using UHV transmission electron diffraction are described. Reliability factor minimizations of the dynamical diffraction intensities establish conclusively the asymmetry in the structure. Fits performed using multilayer subsurface relaxations to match analytical strain solutions demonstrate the existence of long range subsurface strain fields extending up to six layers into the bulk.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
