Abstract

In this paper, structures of InAs/GaAs and SiGe/Si rolled-up nanotubes (RUNTs) are characterized by using high-resolution transmission electron microscopy (HRTEM) and spatially-resolved electron energy loss spectroscopy. Free-standing RUNTs as well as their cross-sections are investigated. It is found that the walls of the nanotubes are mainly crystalline, and are composed of alternating crystalline and oxide containing noncrystalline layers. Defects form in some nanotubes, where the rolling involves a misorientation.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call