Abstract
Raman spectra of glasses in the Li2O-SiO2 system (41.3 ⩽ Li2O ⩽ 61.3 mol%), prepared by rapid quenching, were measured. The proportions of SiO4 units with 1–4 non-bridging oxygens per silicon (NBO/Si) and the fractions of bridging oxygen, non-bridging oxygen and free or full-active oxygen were determined for these glasses from quantitative analysis of the Raman spectra obtained. X-ray structural analysis of Li2O-SiO2 showed an increasing elongation of the average atomic distance of the Si-O pair with increase in Li2O content due to weakening of the Si-O bond.
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