Abstract
The structure of Nb thin films grown by molecular beam epitaxy on sapphire has been studied using high-resolution x-ray scattering techniques. Transverse scans of the x-ray wave vector transfer through the (110)Nb Bragg peak show diffuse scattering with a Lorentzian-squared profile, and satellite Bragg peaks for certain orientations of the crystal. The former feature arises from a random, two-dimensional network of Nb domains, and the latter from a periodic distortion of the Nb films at the terrace edges of the vicinal sapphire substrate.
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