Abstract
ABSTRACTA systematic study of the structure of tilt grain boundaries in aluminum has been initiated. High resolution transmission electron microscopy is being used to examine the interface structure of several bicrystals with <110> tilt axes. In this paper, we report the structure determination of a grain boundary close to the Σ9 (221) symmetric orientation. The grain boundary plane, which appears wavy at lower magnification, is actually composed of atomically flat microfacets. Two distinct, symmetric structures with (221) boundary planes have been identified within individual microfacets. These observations have been compared with structures calculated using the Embedded Atom Method. The semi-quantitative comparison between the observed and predicted grain boundary structures is accomplished using multislice image simulations based on the calculated structures. The results of these comparisons and the evaluation of the relative energies of the microfacets are discussed.
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