Abstract
The present paper reports a complete study on the correlation between structure, morphology, and magnetic properties of (111)-oriented cobalt ferrite (CoFe2O4) thin films with varying film thickness. The CoFe2O4 (CFO) thin films were deposited on Pt-coated Si substrate by pulsed laser deposition (PLD) at 550 °C. The x-ray diffraction (XRD) data confirms the (111)-oriented growth of the cobalt ferrite films. The in-plane morphology of the films in the field emission scanning electron micrographs ensure the Stranski–Krastanov growth mechanism, and the atomic force micrographs confirms the effect of lattice relaxation on the morphology of the films with varying thickness. The possible cation distributions for the samples were determined from the Raman spectroscopy, which revealed the crystal structure-magnetic property correlations in cobalt ferrite films. The magnetic hysteresis (M−H) loops show a significant spin reorientation by showing the variation between the in-plane (IP) and out-of-plane (OP) magnetization. The presence of a kink on the OP M−H loops and its variation with film thickness clearly establishes the existence of competing magnetic anisotropies in the films. The high coercivity (HC) values observed for OP magnetization of cobalt ferrite films with thicknesses 115 nm and 125 nm may be explored for possible room-temperature (RT) device applications.
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