Abstract
Amorphous Co x C 1− x thin films, with x in the range of 60–75% in atomic percentage, have been prepared by pulsed filtered vacuum arc deposition. The structures of the films were characterized by transmission electron microscopy, X-ray diffraction, and X-ray photoelectron spectroscopy. The in-plane magnetic hysteresis loops were measured by a superconducting quantum interference device magnetometer at room temperature. The electrical transport properties were measured by the four-probe technique at various temperatures ranging from 20 to 300 K. The films were found to be magnetically soft with coercivities in the range of 2 to 12 Oe, resistivities in the range of 130 to 300 μ Ω cm, and magnetic saturation flux densities in the range of 6 to 13 kG. The films also showed good thermal stability in their structural, electrical and magnetic properties upon annealing up to 200 °C in a vacuum furnace.
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