Abstract
The Pendellösung intensity beats in wavelength scale were measured to determine the structure factors of InP crystal by the energy-dispersive diffraction method. The clear beats obtained for eleven low-order reflections from the 111 to 440 reflections were analyzed to evaluate the structure factors with their wavelength dependence on the basis of the dynamical diffraction theory. The values were different from those measured by Sirota and Gololobov (Acta Crystallogr. A25 (1969) 223) using the powder diffraction method, especially for high-order reflections. A discussion is made on the charge density of valence electrons using the obtained structure factors and the tetrahedral charge distortion model. The measured wavelength dependence of the structure factors can be interpreted well by the anomalous dispersion terms of Cromer and Liberman (J. Chem. Phys. 53 (1970) 1891).
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